Sharp solar modules are PID-resistant (1) – this has now been
officially confirmed to the Japanese technology company by the Fraunhofer
Center for Silicon Photovoltaics (CSP). One module each from 13 renowned
manufacturers was independently tested for potential-induced
degradation (PID) by Fraunhofer CSP at 50°C and a relative humidity of 50
per cent. PID can occur in the event of negative potential to earth and
is accelerated by high system voltages, temperatures and humidity. Only
four of the 13 modules tested passed the test and exhibited no signs of
degradation.The remaining modules from other manufacturers showed in
some cases serious collapses in poweroutputs of up to 98 per cent
compared with their initial power outputs.The result confirms that,
thanks to its ongoing innovations and long-term experience, Sharp is one
of the leading manufacturers of solar modules. Additionally, rigorous
controls safeguard the consistently high quality standard of the Sharp PV
modules.“This is a very pleasing result for us which clearly shows that
there are major differences between the module manufacturers. At the
same time it confirms the reliability of our own PID quality tests which
are conducted in accordance with the stringent NREL standards (2) on
each new product,”declares Peter Thiele, Executive Vice President Sharp
Energy Solution Europe. Please click
here for detailed information on the
PID test.
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(1) Sharp module tested: ND-R250A52
(2) National Renewable Energy Laboratory (NREL) standards are in excess of 96 hours at 60°C, 85 percent humidity and 1000V.