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Sharp Solar modules confirmed as PID-resistent

Sharp delivers convincing performance in independent test by Fraunhofer CSP


Sharp solar modules are PID-resistant (1) – this has now been officially confirmed to the Japanese technology company by the Fraunhofer Center for Silicon Photovoltaics (CSP). One module each from 13 renowned manufacturers was independently tested for potential-induced degradation (PID) by Fraunhofer CSP at 50°C and a relative humidity of 50 per cent. PID can occur in the event of negative potential to earth and is accelerated by high system voltages, temperatures and humidity. Only four of the 13 modules tested passed the test and exhibited no signs of degradation.The remaining modules from other manufacturers showed in some cases serious collapses in poweroutputs of up to 98 per cent compared with their initial power outputs.The result confirms that, thanks to its ongoing innovations and long-term experience, Sharp is one of the leading manufacturers of solar modules. Additionally, rigorous controls safeguard the consistently high quality standard of the Sharp PV modules.“This is a very pleasing result for us which clearly shows that there are major differences between the module manufacturers. At the same time it confirms the reliability of our own PID quality tests which are conducted in accordance with the stringent NREL standards (2) on each new product,”declares Peter Thiele, Executive Vice President Sharp Energy Solution Europe. Please click here for detailed information on the PID test.

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(1) Sharp module tested: ND-R250A52
(2) National Renewable Energy Laboratory (NREL) standards are in excess of 96 hours at 60°C, 85 percent humidity and 1000V.

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Newsticker: Sharp Solar modules confirmed as PID-resistent PDF 783.75 KB 01.08.2012